ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,223, issued on April 7, was assigned to NEC Corp. (Tokyo). "Information processing apparatus, information processing method, and computer p... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,224, issued on April 7, was assigned to TriSpace Technologies (OPC) Pvt Ltd. (Bengaluru, India). "System and method for feature sub-image d... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,225, issued on April 7, was assigned to Tencent Technology Co. Ltd. (Shenzhen, China). "Image processing method and apparatus, electronic d... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,226, issued on April 7, was assigned to KWS SAAT SE & Co. KGaA (Einbeck, Germany). "Method and system for automated plant image labeling" w... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,227, issued on April 7, was assigned to ALi Corp. (Hsinchu, Taiwan). "Image dehazing method and video dehazing method" was invented by Lun ... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,228, issued on April 7, was assigned to MYDIMODA INC. (The Colony, Texas). "Textile matching using color and pattern recognition and method... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,229, issued on April 7, was assigned to MEIJI UNIVERSITY (Tokyo) and NS Solutions Corp. (Tokyo). "Information processing apparatus, informa... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,230, issued on April 7, was assigned to GM Global Technology Operations LLC (Detroit). "System and method for training and utilizing an obj... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,231, issued on April 7, was assigned to SONY GROUP Corp. (Tokyo). "Information processing device and information processing method" was inv... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,232, issued on April 7, was assigned to HITACHI LTD. (Tokyo). "System for learning new visual inspection tasks using a few-shot meta-learni... Read More